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TecLearn Technical Literature Training File
Excerpt from TEMA
Last Update: 2016-11-22
Number of Records: 100247
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339 hits for:
nanoelectronics
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Bäuerle, Christopher ; Meunier, Tristan ; Wieck, Andreas Dirk ; Tarucha, Seigo / CNRS UPR 2940, Institut Neel, INPG, Universite Joseph Fourier, Grenoble 1, FR ; Ruhr-Universität Bochum, DE ; University of Tokyo, JP
Einzelne Elektronen surfen auf einer Schallwelle / Single electrons transported on an acoustic wave
Physik in unserer Zeit / 2012 / 20120103206
Journal
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Wang, Kang L. ; Ovchinnikov, Igor ; Xiu, Faxian ; Khitun, Alex ; Bao, Ming / University of California Los Angeles (UCLA), CA, US
From
nanoelectronics
to nano-spintronics
Orienteering for Nano Convergence, Nano Korea, International Nanotech Symposium and Exhibition, 7 - Journal of Nanoscience and Nanotechnology / 2011 / 20110300781
Journal; Conference Paper
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Alshareef, H.N. ; Quevedo-Lopez, M.A. ; Majhi, P. / King Abdullah University of Science and Technology, Thuwal, SA ; University of Texas at Dallas, Richardson, TX, US ; SEMATECH, Austin, TX, US
Contact materials for
nanoelectronics
/ Kontaktwerkstoffe für die Nanoelektronik
MRS Bulletin / 2011 / 20111100098
Journal
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4
Herr, Daniel J.C. / Semiconductor Research Corp., Research Triangle Park, NC, US
Directed block copolymer self-assembly for
nanoelectronics
fabrication / Direkte Selbstassemblierung von Blockcopolymeren für die Herstellung von nanoelektronischen Bauteilen
Journal of Materials Research / 2011 / 20110301718
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Yao, Jun ; Zhong, Lin ; Natelson, Douglas ; Tour, James M. / Rice University, Houston, TX, US
Silicon oxide: A non-innocent surface for molecular electronics and
nanoelectronics
studies / Siliciumoxid: Eine nicht-harmlose Oberfläche für Molekularelektronik- und Nanoelektronikuntersuchungen
Journal of the American Chemical Society / 2011 / 20110203353
Journal
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Zschech, Ehrenfried ; Wyon, Christophe ; Murray, Conal E. ; Schneider, Gerd / Fraunhofer-Institut für Zerstörungsfreie Prüfverfahren (IZFP), Dresden, DE ; MINATEC, CEA-LETI, Grenoble, FR ; IBM T.J. Watson Research Center, Yorktown Heights, NY, US ; Helmholtz-Zentrum Berlin für Materialien und Energie, DE
Devices, materials, and processes for
nanoelectronics
: Characterization with advanced X-ray techniques using lab-based and synchrotron radiation sources / Geräte, Werkstoffe und Prozesse für die Nanoelektronik: Beschreibung mit fortgeschrittener Röntgentechnik mit laborbasierten und Synchotronstrahungsquellen.
Advanced Engineering Materials / 2011 / 20110804121
Journal
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Russer, P. ; Russer, J.A. / TU München, DE
Nanoelectronic RF Josephson Devices
IEEE Transactions on Microwave Theory and Techniques / 2011 / 20111008155
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8
Vijayakumar, P. ; Narayanan, P. ; Koren, I. ; Mani Krishna, C. ; Moritz, C.A. / Department of Electrical & Computer Engineering, University of Massachusetts, Amherst, MA, US
Impact of nanomanufacturing flow on systematic yield losses in nanoscale fabrics
NANOARCH, IEEE/ACM International Symposium on Nanoscale Architectures, 2011 / 2011 / 20110706280
Conference Paper
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Doering, Robert / Texas Instruments, Dallas, TX, US
Potential opportunities for nanotechnology in electronics manufacturing
Solid State Technology / 2011 / 20110204330
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Despotuli, A. ; Andreeva, A. / Institute of Microelectronics Technology and High-Purity Materials, RAS, Chernogolovka, RU
R&D of micron sized nanoionic supercapacitors for self-powered MEMS in deep-sub-voltage regime
MEMSTECH, International Conference on Perspective Technologies and Methods in MEMS Design, 2011 / 2011 / 20110803255
Conference Paper
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Bendib, Toufik ; Djeffal, Faycal / Department of Electrical Engineering, Universite de Batna, DZ
Electrical Performance Optimization of Nanoscale Double-Gate MOSFETs Using Multiobjective Genetic Algorithms
IEEE Transactions on Electron Devices / 2011 / 20111106799
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Scappucci, G. ; Capellini, G. ; Johnston, B. ; Klesse, W.M. ; Miwa, J.A. ; Simmons, M.Y. / University of New South Wales, Sydney, NSW, AU ; Universita di Roma TRE, IT ; Macquarie University, Sydney, NSW, AU
A complete fabrication route for atomic-scale, donor-based devices in single-crystal germanium
Nano Letters / 2011 / 20110701843
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Anatoly, G. ; Olga, K. ; Nina, L. ; Vladislav, N. / Belarus State University of Informatics and Radioelectronics, Minsk, BY ; Belarus National Technical University, Minsk, BY
Y2O3 and MoS2 electronic properties simulation
MEMSTECH, International Conference on Perspective Technologies and Methods in MEMS Design, 2011 / 2011 / 20110803256
Conference Paper
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14
Huber, Beatrice
Auf dem Weg zur Nanoelektronik. Graphen - mögliches Ersatzmaterial für Silizium
Elektrotechnik ET, Aarau / 2011 / 20110404131
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15
Mathis, Wolfgang ; Wang, Gen ; Xiong, Jian / Universität Hannover, DE
Über einige Grundprobleme einer zukünftigen Nanoelektronik
ntz. Fachzeitschrift für Informations- und Kommunikationstechnik / 2011 / 20110701189
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Forestiere, C. ; Miano, G. ; Chiariello, A.G. ; Maffucci, A. ; Maksimenko, S.A. ; Slepyan, G.Y. / Department of Electrical Engineering, Universita di Napoli Federico II, IT ; DAEIMI, Universita di Cassino, IT ; Institute for Nuclear Problems, Belarus State University, Minsk, BY
Electrodynamics of multiwall carbon nanotube interconnects
ICEAA, International Conference on Electromagnetics in Advanced Applications, 2011, ICEAA, IEEE-APS Topical Conference on Antennas & Propagation in Wireless Communications, 2011 / 2011 / 20111105671
Conference Paper
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Li, G.Q. ; Deng, J.K. / Department of Physics, Tsinghua University, Beijing, CN
The conductance of the NC3 nanodevices: different partial substitution of carbon by nitrogen in graphite
Applied Physics A (Materials Science and Processing) / 2011 / 20111204014
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Riyadi, Munawar A. ; Arora, Vijay K. / Faculty of Electrical Engineering, Universiti Teknologi Malaysia, Skudai, Johor Bahru, MY
The channel mobility degradation in a nanoscale metal-oxide-semiconductor field effect transistor due to injection from the ballistic contacts
Journal of Applied Physics / 2011 / 20111107061
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Manavizadeh, N. ; Pourfath, M. ; Raissi, F. ; Asl-Soleimani, E. / K.N. Toosi University of Technology, Tehran, IR ; Institute for Microelectronics, TU Wien, AT ; University of Tehran, IR
A comprehensive study of nanoscale Field Effect Diodes
EuroSimE, International Conference on Thermal, Mechanical & Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, 12 / 2011 / 20110508574
Conference Paper
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Rigante, S. ; Livi, P. ; Hierlemann, A. ; Ionescu, A.M. / Ecole Polytechnique Federale de Lausanne (EPFL), CH ; Department of Biosystems Science & Engineering, ETH Zürich, Basel, CH
A simulation study of N-shell silicon nanowires as biological sensors
ULIS, International Conference on Ultimate Integration on Silicon, 12 / 2011 / 20110508622
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